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KLA-TENCOR FT-750 Film Thickness Inspection
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KLA TENCOR 2800
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AMAT SEMVision G3 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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SONOSCAN C-SAM 3100 (Acoustical Microscope)
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Darkfield Inspection
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Leica MIS201 Ergoplan Inspection Station
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PROMETRIX FT-750 Film Thickness Measuring
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HITACHI FB2000 + FB2100 FIB SYSTEMS
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Nikon NEXIV VMZ-R3020 Multisensor 3D Video Meaurement CMM Vintage 2015 Type 2
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SEM – Defect Review (DR)
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Macro-Defect
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BIORAD QS-408M Manual FT-IR Spectrometer for Epi, SiN, BPSG
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TENCOR P20h Long Scan Profiler
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Rudolph NSX 90 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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SEM – Critical Dimension (CD) Measurement
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