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Metrology

View cart “Olympus MX51 Inspection Microscope” has been added to your cart.
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  • KLA SP1 DLS 1 Surfscan

    KLA SP1 DLS for sale

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  • Atomic Force Microscope (AFM)

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  • KLA UV1280SE 二手半导体设备销售, 중고 반도체 장비 판매

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  • Hitachi (Semiconductor) RS 5500

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  • SEM – Critical Dimension (CD) Measurement

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  • Overlay Measurement System

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  • BIORAD QS-1200 FT-IR Spectrometer 300mm

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  • TENCOR M-Gage 300 Non Contact Resistance monitor

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  • Olympus MX40 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • SEM – Critical Dimension (CD) Measurement

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  • KLA-TENCOR AlphaStep 300 Profilometer

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  • Hitachi (semiconductor) S 9380 II

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  • AMAT SEMVision G3

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  • Met One – Model 214-220-1

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  • Darkfield Inspection

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