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Metrology

View cart “SEM – Critical Dimension (CD) Measurement” has been added to your cart.
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  • Atomic Force Microscope (AFM)

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  • KLA UV1280SE 二手半导体设备销售, 중고 반도체 장비 판매

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  • Hitachi (Semiconductor) RS 5500

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  • Video Measuring System

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  • SEM – Defect Review (DR)

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  • Macro-Defect

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  • BIORAD QS-408M Manual FT-IR Spectrometer for Epi, SiN, BPSG

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  • TENCOR P20h Long Scan Profiler

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  • Rudolph NSX 90 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • SEM – Critical Dimension (CD) Measurement

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  • Edge Defect

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  • KLA-TENCOR UV 1080 UV Film Thickness Tool

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  • KLA TENCOR AIT II

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  • AMAT Uvision 200

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  • Dektak 3030

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