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Metrology

View cart “Nikon NEXIV VMZ-R3020 Multisensor 3D Video Meaurement CMM Vintage 2015 Type 2” has been added to your cart.
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  • Hitachi S-3400N

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  • FT-IR

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  • Darkfield Inspection

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  • BIORAD Q5 Overlay Metrology Tool

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  • RIGAKU 3700H Xray Fluorescence Wafer/Disk Analyzer

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  • used semiconductor equipment

    Rudolph FE IV Ellipsometer

    $0.00
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  • KLA SP1 DLS 1 Surfscan

    KLA SP1 DLS for sale

    $0.00
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  • Leica INM100 Wafer Inspection Microscope, Brightfield and Darkfield

    $25,000.00
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