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Metrology

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  • FT-IR

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  • Darkfield Inspection

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  • ADE Episcan 1000 FT-IR

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  • RIGAKU 3640 Xray Fluorescence Wafer/Disk Analyzer

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  • used semiconductor equipment

    二手半导体设备、库存半导体设备、翻新半导体设备、二手测试设备、翻新测试设备、库存测试设备、二手自动测试设备、二手印制电路板（pcb）组装设备、组装设备、二手电子组装设备、二手电子测试设备、半导体固定设备

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  • KLA SP1 Classic FOR SALE

    KLA SP1 CLASSIC Wafer Surface Analysis WAFER INSPECTION

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  • SEM – Critical Dimension (CD) Measurement

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  • Macro-Defect

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  • BROOKFIELD RVT Viscometer

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  • ADE 9500 Ultrascan Wafer Inspection System

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  • KLA KLA5200

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  • Parts/Options

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  • Acoustic Micro Imaging

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  • NANOMETRICS Nanospec 181 Film Thickness Measurement

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  • KLA Tencor RS75 x 2sets 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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