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“SEM – Critical Dimension (CD) Measurement” has been added to your cart.
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Brightfield Inspection
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Luminescence Measurement
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CLIMET Ultimate 100 Aerosol Particle Counter
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Leica Polylite 88 – Reichert Incident Light Microscope – Wafer Inspection
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KLA KLA5200 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Darkfield Inspection
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Atomic Force Microscope (AFM)
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NANOMETRICS Nanospec 2100 Film Thickness Measurement
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30 Day Warranty Parts, AMAT, LAM, Novellus, Nikon,Varian, KLA, TEL, SVG, Cryogenics, Gasonics, Hitachi, Keithley, HP, MFC,
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KLA-Tencor Surfscan 6220 Defect Inspection System
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Darkfield Inspection
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Darkfield Inspection
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BIORAD Q6 Overlay Metrology Tool
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SAGAX Isoscope 125 Film Thickness Monitor
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Rudolph FE IV Ellipsometer 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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