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Hitachi S-9200
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KLA-Tencor – KLA2139
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APPLIED MATERIALS SEMVision G2 – Defect Review Station (Module Only)
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Orbot WF736 (Darkfield Inspection)
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RUDOLPH TECHNOLOGIES INC. – Focus FE III Ellipsometer
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Nicolet 410 (FT-IR) Spectrometer
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KLA-Tencor Surfscan 6220 Defect Inspection System
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Rudolph FE-VII Ellipsometer
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Rudolph FE-IV Ellipsometer
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KLA ASET F5
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Zeiss Axiotron II Microscopes (8 units available)
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NanoMetrics NanoSpec 8300
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Olympus MX50 Microscope & AL110-L8 Autoloader
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HITACHI S-3400N SEM
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Dektak 150 Surface Profiler + Warranty + Delivery to USA
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