Hitachi S-3400N SEM
The Hitachi S-3400N SEM is a high performance, user-friendly scanning electron microscope with new improvements that allow the best results for a wide range of applications.
The tungsten SEM is capable of high and low vacuum operation and comes with SE and BSE detectors.
Fully eucentric, 5 axis manual stage with high tilt capability,
and the large chamber allows for very tall and oddly shaped samples to be introduced.
Installation and 90 days warranty INCLUDED. Please ask for Warranty info.
The Hitachi 3400N will be remanufactured to OEM specification,
and analytical capabilities like EDS or EBSD can easily be added.