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Metrology
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“RUDOLPH TECHNOLOGIES INC. – Focus FE III Ellipsometer” has been added to your cart.
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“RUDOLPH TECHNOLOGIES INC. – Focus FE III Ellipsometer” has been added to your cart.
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KLA ASET F5 Thin Film Measurement, 测量薄膜, 박막 측정,
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Applied Materials Uvision 3
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KLA Aset F5X
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Advanced Metrology Systems LLC (AMS) IR3000
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Nikon MM 60
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APPLIED MATERIALS SEMVISION G2
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Hitachi (Semiconductor) RS 5500
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Axiospect 300 Optical 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Zeiss Axiotron II Microscopes (8 units available)
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KLA 2132 wafer defect inspection
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KLA 6420 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Hitachi CG4000
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Applied Materials Complus 4T
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Nikon MM 60 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Hitachi S-9200
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KLA TENCOR AIT II
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AMAT SEMVision G3
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NanoMetrics NanoSpec 8300
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KLA 2131 Defect Wafer Inspection System 200mm
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KLA SEM eCD-2 inspection measurement analysis – used metrology equipment
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Hitachi S-3400N
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Leica INS 3300
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Applied Materials Complus MP
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Rudolph NSX 90
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KLA-Tencor – KLA2139
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KLA AIT XP+
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AMAT SEMVision G3 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Olympus MX50 Microscope & AL110-L8 Autoloader
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KLA 2608 Defect Review Station 200mm
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KLA Surfscan SP1 DLS Particle Measurement – used semiconductor equipment
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