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KLA 2131 Defect Wafer Inspection System 200mm
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KLA SEM eCD-2 inspection measurement analysis – used metrology equipment
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Hitachi S-3400N
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Leica INS 3300
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Applied Materials Complus MP
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Rudolph NSX 90
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KLA-Tencor – KLA2139
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KLA AIT XP+
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AMAT SEMVision G3 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Olympus MX50 Microscope & AL110-L8 Autoloader
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KLA 2608 Defect Review Station 200mm
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KLA Surfscan SP1 DLS Particle Measurement – used semiconductor equipment
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Hitachi S8820HSA
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Applied Materials Nanosem 3D
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Rudolph NSX 90 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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