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Metrology

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  • 30 Day Warranty Parts, AMAT, LAM, Novellus, Nikon,Varian, KLA, TEL, SVG, Cryogenics, Gasonics, Hitachi, Keithley, HP, MFC,

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  • Acoustic Micro Imaging

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  • ADE 9500 Ultra Gauge

    ADE 9500 for sale

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  • ADE 9500 Ultrascan Wafer Inspection System

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  • ADE 9600 Ultrascan

    ADE 9600 Ultrascan High Speed Measurement and Sorting System for sale

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  • ADE Episcan 1000 FT-IR

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  • AMAT SEMVision G3

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  • AMAT SEMVision G3 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • AMAT Uvision 200

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  • AMAT Uvision 200 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Applied System Veritystem 3

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  • Atomic Force Microscope (AFM)

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  • Automated Thickness Measurement System

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  • Axiospect 300 Optical

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  • Axiospect 300 Optical 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • BIORAD Q8 Overlay Metrology Tool

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  • BIORAD Q5 Overlay Metrology Tool

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  • BIORAD Q6 Overlay Metrology Tool

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  • BIORAD Q7 Overlay Metrology Tool

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  • BIORAD Q7/Q8 Overlay Metrology Tool

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  • BIORAD QS-1200 FT-IR Spectrometer 300mm

    $0.00
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  • BIORAD QS-300 FT-IR Spectrometer 200mm

    $0.00
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  • BIORAD QS-408M Manual FT-IR Spectrometer for Epi, SiN, BPSG

    $0.00
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  • BIORAD QS-500 FT-IR Spectrometer

    $0.00
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  • Brightfield Inspection

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  • Brightfield Inspection

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  • Brightfield Inspection

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  • Brightfield Inspection

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  • Brightfield Inspection

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  • BROOKFIELD DV-11+ Viscometer

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  • BROOKFIELD RVT Viscometer

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  • CLIMET Ultimate 100 Aerosol Particle Counter

    $0.00
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  • CR TECHNOLOGY UF160-0 Xray System

    $0.00
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  • Critical Dimension (CD) Measurement (non SEM)

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  • Darkfield Inspection

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  • Darkfield Inspection

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  • Darkfield Inspection

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  • Darkfield Inspection

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  • Darkfield Inspection

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  • Darkfield Inspection

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  • Darkfield Inspection

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  • Darkfield Inspection

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  • Darkfield Inspection

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