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Metrology

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  • Film Thickness measurment

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  • HIAC Model 5120 Particle Counter

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  • Met One – Model 214-220-1

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  • SONOSCAN C-SAM 3100 (Acoustical Microscope)

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  • Shimadzu DUH 202 Ultra Micro Hardness Tester

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  • Darkfield Inspection

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  • SEM – Critical Dimension (CD) Measurement

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